High Resolution X-ray Diffractometer

Description

Flexible X-ray platform (Diffraction, Scattering, Reflection)

Manufacturer and model

Rigaku - Smartlab

Technical specifications

• Copper 2.2kW tube, focal point 0.4mm x 12mm
• Large surface 2D detector HyPix 3000
• Samples up to 200mm diameter
  • Horizontal sample stage, allowing various sample shapes.

Axes

• High-res Goniometer (Theta, 2-Theta, step 0.0001°)
• Eulerian cradle (Z, chi, phi)
• In-Plane axis (2-theta-chi + phi)
• Sample flatness corrections ±5° (Rx, Ry)
• Lateral mapping ±50mm (X, Y)

Incident beam conditionning 

• Monochromator 2x Ge(220) (32 arcsec)
• Monochromator 4x Ge(220) (12 arcsec)
• Divergent beam (Bragg-Brentano)
• Parallel Beam (X-ray mirror)
• Soller slits
• Simple slits
• Collimators

Diffracted beam conditionning 

• Analyzer 2x Ge(220) for triple-axix measurement
• K-beta filter
• Slits
• Attenuators

Examples of available processes

• XRD polycrystals
• XRD monocrystals
• XRR reflectivity
• HRXRD monocrystals (triple axis)
• RSM
• GIXRD
• 2D-GISAXS / WAXS
• In-Plane Diffraction
• Texture / Pole Figure
• X-Y mapping complete (<= 100mm diam.) or partial (up to 150mm diam.)
• Data analysis
  • XRD powder
  • XRD bulk
  • XRR
  • HRXRD / RSM
  • SAXS
  • Texture
  • Crystallography Open Database (COD)
  • Multi-dimensional data visualisatio