AFM Park System NX20

Description

Atomic force microscope for the automation of roughness and surface topography measurements

Manufacturer & model

Park System NX20

Technical specifications

• Sample holder 200 mm

• Motorized X Y and rotation positionning

• Maximum image size 100 um x 100 um

• Maximum Z for scanning 15µm

• Software: SmartScan

• Software: Park XEA for automation 

Available processes

• Contact mode

• Tapping mode

• True Non-contact mode 

• PinPoint nanomechanical mode 

Examples of metrology on electro-resin